Publications
Applications
- Ultrafast spectroscopy
- Transient absorption spectroscopy
- Sum-frequency spectroscopy
- Stimulated Raman scattering
- 2D electronic spectroscopy
- 2D infrared spectroscopy
- Fluorescence spectroscopy
- Photoemission spectroscopy
- Transient grating spectroscopy
- Flash photolysis
- Z-scan
- Advanced microscopy
- CARS and SRS microscopy
- Ultrafast electron microscopy
- Transient absorption microscopy
- Nonlinear microscopy
- High-energy and attosecond science
- THz generation
- High harmonic generation
- X-ray generation
- Laser source development
- Nonlinear optics
- OPCPA
- Laser pumping and seeding
- Pulse characterization
- Repetition rate locking
- CEP stabilization
- Micro and nanofabrication
- Photopolymerization
- Surface nanostructuring
- Color center formation
- Volume modification
- Laser–tissue interaction
- Industrial applications
- Stent cutting
- Fiber cleaving
- Periodic surface structuring
- Polymer polishing
- Stainless steel polishing
- Selective ablation
- Milling of complex 3D structures
- High-contrast marking
- Precision parts cutting
Products
- Femtosecond Lasers
- PHAROS
- CARBIDE
- FLINT
- Harmonic Generators
- HG for PHAROS
- HG for CARBIDE
- HIRO
- SHBC
- Tunable Wavelength Sources
- ORPHEUS
- ORPHEUS-MIR
- ORPHEUS-ONE
- ORPHEUS-N
- ORPHEUS-F
- ORPHEUS-TWINS
- ORPHEUS-PS
- I-OPA
- OPA for Ti:Sapphire Lasers
- TOPAS-PRIME
- TOPAS-PRIME-HE
- TOPAS-TWINS
- TOPAS-SHBC-400
- TOPAS-PS-800
- OPCPA Systems
- ORPHEUS-OPCPA
- OPCPA-HE
- Spectroscopy Systems
- HARPIA
- HARPIA-TA
- HARPIA-TF
- Microscopy Sources
- CRONUS-2P
- Autocorrelators
- GECO
Novel UEM Setup for Improved Resolution and Extended Experimental Capabilities
T. Gage, H. Liu, I. Arslan, and R. D. Schaller, Microscopy and Microanalysis S2 (26), 434-436 (2020).
Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy
O. Zandi, A. E. Sykes, R. D. Cornelius, F. M. Alcorn, B. S. Zerbe, P. M. Duxbury, B. W. Reed, and R. M. van der Veen, Nature Communications 1 (11) (2020).
Observation of Anisotropic Strain-Wave Dynamics and Few-Layer Dephasing in MoS2 with Ultrafast Electron Microscopy
Y. Zhang, and D. J. Flannigan, Nano Letters 11 (19), 8216-8224 (2019).
Defect-mediated phonon dynamics in TaS2 and WSe2
D. R. Cremons, D. A. Plemmons, and D. J. Flannigan, Structural Dynamics 4 (4), 044019 (2017).
Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique
A. Adhikari, J. K. Eliason, J. Sun, R. Bose, D. J. Flannigan, and O. F. Mohammed, ACS Applied Materials & Interfaces 1 (9), 3-16 (2017).
Picosecond Fresnel transmission electron microscopy
K. B. Schliep, P. Quarterman, J. Wang, and D. J. Flannigan, Applied Physics Letters 22 (110), 222404 (2017).
Ultrafast electron microscopy integrated with a direct electron detection camera
Y. M. Lee, Y. J. Kim, Y. Kim, and O. Kwon, Structural Dynamics 4 (4), 044023 (2017).
Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes
D. A. Plemmons, and D. J. Flannigan, Chemical Physics Letters 683, 186-192 (2017).
Femtosecond electron imaging of defect-modulated phonon dynamics
D. R. Cremons, D. A. Plemmons, and D. J. Flannigan, Nature Communications 1 (7) (2016).
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging
A. R. Bainbridge, C. W. B. Myers, and W. A. Bryan, Structural Dynamics 2 (3), 023612 (2016).