Novel UEM Setup for Improved Resolution and Extended Experimental Capabilities

T. Gage, H. Liu, I. Arslan, and R. D. Schaller, Microscopy and Microanalysis S2 (26), 434-436 (2020).

Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy

O. Zandi, A. E. Sykes, R. D. Cornelius, F. M. Alcorn, B. S. Zerbe, P. M. Duxbury, B. W. Reed, and R. M. van der Veen, Nature Communications 1 (11) (2020).

Defect-mediated phonon dynamics in TaS2 and WSe2

D. R. Cremons, D. A. Plemmons, and D. J. Flannigan, Structural Dynamics 4 (4), 044019 (2017).

Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique

A. Adhikari, J. K. Eliason, J. Sun, R. Bose, D. J. Flannigan, and O. F. Mohammed, ACS Applied Materials & Interfaces 1 (9), 3-16 (2017).

Picosecond Fresnel transmission electron microscopy

K. B. Schliep, P. Quarterman, J. Wang, and D. J. Flannigan, Applied Physics Letters 22 (110), 222404 (2017).

Ultrafast electron microscopy integrated with a direct electron detection camera

Y. M. Lee, Y. J. Kim, Y. Kim, and O. Kwon, Structural Dynamics 4 (4), 044023 (2017).

Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes

D. A. Plemmons, and D. J. Flannigan, Chemical Physics Letters 683, 186-192 (2017).

Femtosecond electron imaging of defect-modulated phonon dynamics

D. R. Cremons, D. A. Plemmons, and D. J. Flannigan, Nature Communications 1 (7) (2016).

Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging

A. R. Bainbridge, C. W. B. Myers, and W. A. Bryan, Structural Dynamics 2 (3), 023612 (2016).



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